Series on Integrated Circuits and Systems: Design for Manufacturability and Statistical Design: A Constructive Approach (Hardcover)
Michael Orshansky; Sani Nassif; Duane Boning
9780387309286
0-387-30928-4
Design for Manufacturability and Statistical Design: A Comprehensive Approach presents a comprehensive overview of methods that need to be mastered in understanding state-of-the-art design for manufacturability.
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and statistical design methodologies. Broadly, design for manufacturability is a set of techniques that attempt to fix the systematic sources of variability, such as those due to photolithography and CMP. Statistical design, on the other hand, deals with the random sources of variability. Both paradigms operate within a common framework, and their joint comprehensive treatment is one of the objectives of this book and an important differentation.
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